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Merging Verification And Test

Reliability concerns throughout a device’s lifetime are driving fundamental changes in where and when these functions occur.

Semiconductor Engineering


While the disciplines of functional verification and test serve different purposes, their histories were once closely intertwined. Recent safety and security monitoring requirements coupled with capabilities being embedded into devices is bringing them closer together again, but can they successfully cooperate to bring about improvements in both? Getting there may be difficult…


To read the full Semiconductor Engineering article by Brian Bailey, click here.